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Shinden-zukuri

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  • Simultaneous multicolor fluorescence imaging by scanning near-field op...
  • Abstract We have developed an easily operable scanning near-field optical microscope for multicolor fluorescence imaging by applying a highly sensitive charge-coupled-device (CCD) camera. The CCD cam...
  • Rating:   1 Star      Views: (2000)     Pages: (0)     Uploaded: Publication Date: Jan 2003
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  • Defect observation on a 12-in. silicon wafer using large sample atomic...
  • Abstract As semiconductor devices have become more highly integrated and miniaturized, defects originating within single-crystal silicon occur more frequently. Defect observation of silicon wafer sur...
  • Rating:   1 Star      Views: (2001)     Pages: (0)     Uploaded: Publication Date: May 2000
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  • Defect observation on a 12-in. silicon wafer using large sample atomic...
  • Abstract As semiconductor devices have become more highly integrated and miniaturized, defects originating within single-crystal silicon occur more frequently. Defect observation of silicon wafer sur...
  • Rating:   1 Star      Views: (2001)     Pages: (0)     Uploaded: Publication Date: May 2000
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