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  • Scanning tunneling microscopy in UHV with an X,Y,Z micropositioner
  • Abstract The extremely high resolution of a scanning tunneling microscope (STM) or atomic force microscope allows the examination of local material faults like dislocations, grain boundaries, and cra...
  • Rating:   1 Star      Views: (2006)     Pages: (0)     Uploaded: Publication Date: Jul 1994
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  • Scanning tunneling microscopy in UHV with an X,Y,Z micropositioner
  • Abstract The extremely high resolution of a scanning tunneling microscope (STM) or atomic force microscope allows the examination of local material faults like dislocations, grain boundaries, and cra...
  • Rating:   1 Star      Views: (2005)     Pages: (0)     Uploaded: Publication Date: Jul 1994
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  • Influence of nitrogen doping on growth rate and texture evolution of c...
  • Abstract Chemical vapor deposition (CVD) diamond films were prepared using a variation in nitrogen addition into the gas source admixture by a direct current CVD method. The influence of nitrogen add...
  • Rating:   1 Star      Views: (2003)     Pages: (0)     Uploaded: Publication Date: Jan 2009
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  • Atomic force microscopy investigations of loaded crack tips in NiAl
  • Abstract Scanning probe microscopy has great advantages over other high-resolution techniques like transmission electron microscopy in that no extensive specimen preparation, such as thinning, is req...
  • Rating:   1 Star      Views: (2003)     Pages: (0)     Uploaded: Publication Date: Mar 1996
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  • Atomic force microscopy investigations of loaded crack tips in NiAl
  • Abstract Scanning probe microscopy has great advantages over other high-resolution techniques like transmission electron microscopy in that no extensive specimen preparation, such as thinning, is req...
  • Rating:   1 Star      Views: (2002)     Pages: (0)     Uploaded: Publication Date: Mar 1996
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  • Low-temperature sample orienting device with two degrees of freedom
  • Abstract We describe a rotating sample holder with two degrees of freedom for galvanomagnetic measurements at low temperatures which allows positioning within 0.5° with a reproducibility of better th...
  • Rating:   1 Star      Views: (2005)     Pages: (0)     Uploaded: Publication Date: Aug 1978
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