Abstract
The extremely high resolution of a scanning tunneling microscope (STM) or atomic force microscope allows the examination of local material faults like dislocations, grain boundaries, and cra...
Abstract
The extremely high resolution of a scanning tunneling microscope (STM) or atomic force microscope allows the examination of local material faults like dislocations, grain boundaries, and cra...
Abstract
Chemical vapor deposition (CVD) diamond films were prepared using a variation in nitrogen addition into the gas source admixture by a direct current CVD method. The influence of nitrogen add...
Rating: Views: (2003)
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Uploaded: Publication Date: Jan 2009
Abstract
Scanning probe microscopy has great advantages over other high-resolution techniques like transmission electron microscopy in that no extensive specimen preparation, such as thinning, is req...
Rating: Views: (2003)
Pages: (0)
Uploaded: Publication Date: Mar 1996
Abstract
Scanning probe microscopy has great advantages over other high-resolution techniques like transmission electron microscopy in that no extensive specimen preparation, such as thinning, is req...
Rating: Views: (2002)
Pages: (0)
Uploaded: Publication Date: Mar 1996
Abstract
We describe a rotating sample holder with two degrees of freedom for galvanomagnetic measurements at low temperatures which allows positioning within 0.5° with a reproducibility of better th...
Rating: Views: (2005)
Pages: (0)
Uploaded: Publication Date: Aug 1978