Abstract
In light of the work from the Industry Council on ESD Target Levels it has become clear that the ESD protection designs for the IC pins may be carrying an unnecessary burden. This burden bec...
Abstract
In light of the work from the Industry Council on ESD Target Levels it has become clear that the ESD protection designs for the IC pins may be carrying an unnecessary burden. This burden bec...
Abstract
FinFET devices have been recently reported to show an unprecedented sensitivity to ESD stress. Detailed failure analyses under ESD stress for these devices reveal a uniquely new mechanism th...