Understanding contact behavior in organic thin film transistors

S. D. Wang, Y. Yan, and K. Tsukagoshi We report the crowding current modeling of contact resistance in organic thin film transistors, and interpret the contact behavior based on the model. For the top-contact configuration, the contact resistance is determined by the transport property of both organic bulk and charge accumulation layer ... [Appl. Phys. Lett. 97, 063307 (2010)] published Fri Aug 13, 2010.