Ultrafast dynamics of antiferromagnetic order studied by femtosecond resonant soft x-ray diffraction

K. Holldack, N. Pontius, E. Schierle, T. Kachel, V. Soltwisch et al. Femtosecond (fs) soft x-ray diffraction at the Eu-M resonance was employed to study the dynamics of antiferromagnetic (AFM) order in a thin film of the magnetic semiconductor EuTe after fs laser excitation. The AFM Bragg peak intensity displays an ultrafast decay with an upper limit for the time con ... [Appl. Phys. Lett. 97, 062502 (2010)] published Tue Aug 10, 2010.