J. Nichols and K.-W. Ng Since the invention of the scanning tunneling microscope (STM), it has been a powerful tool for probing the electronic properties of materials. Typically STM designs capable of obtaining resolution on the atomic scale are limited to a small area which can be probed. We have built an STM capable of c ... [Rev. Sci. Instrum. 82, 013706 (2011)] published Fri Jan 28, 2011.
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