Nanomeasurements of electronic and mechanical properties of fullerene embedded Si(111) surfaces

Chih-Pong Huang, Chih-Chuan Su, Wan-Sheng Su, Chiao-Fang Hsu, and Mon-Shu Ho This study describes the feasibility of fabricating of a single layer of fullerene embedded Si surface through a controlled self-assembly mechanism in an ultrahigh vacuum (UHV) chamber. The characteristics of the fullerene embedded Si surface are investigated directly using UHV-scanning probe micros ... [Appl. Phys. Lett. 97, 061908 (2010)] published Wed Aug 11, 2010.