Focused-ion-beam-fabricated nanoscale magnetoresistive ballistic sensors


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      Views: (2001)   Date: (Publication Date: Jan 2005)   Pages: ()
    • Author:  Khizroev  S. Hijazi  Y. Chomko  R. Mukherjee  S. Chantrell  R. Wu  X. Carley  R. Litvinov  D. Center for Nanoscale Magnetic Devices  Florida International University  Miami  Florida 33174;  

    • Abstract:  Abstract In this letter, authors demonstrate magnetoresistance of the order of 18% at room temperature for a focused-ion-beam-fab ricated nanoconstriction with critical dimensions of the order of 35 nm. The main purpose of this work is to show that focused ion beam (FIB)-fabricated nanoconstrictions are relatively reproducible and thus could be further developed to obtain substantially larger magnetoresistance. Magnetoresistance is expected to increase if critical dimensions of nanoconstrictions are further reduced. The proposed focused-ion-beam-fab ricated nanoconstrictions could be also used as devices to study the electron “ballistic” regime in the emerging fields of Spintronics and magnetoresistive random access memory (MRAM).

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