Mechanical Measurements&Metrology
John O'Donnell, energy and climate entrepreneur, discusses solar thermal power. The Energy Seminar m...
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Lecture Series on Energy Resources and Technology by Prof.S.Banerjee,Department of Electrical Engine...
IEEE |
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Views: (2001) Date: (Publication Date: Jun 1985) Pages: () |
Abstract: Abstract We show that thermal wave detection and analysis can be performed, in a noncontact and highly sensitive manner, through the dependence of sample optical reflectance on temperature. Applications to the study of microelectronic materials are illustrated by an example of measuring the thickness of thin metal films.