Relationships between common source, common gate, and common drain FETs


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      Views: (2108)   Date: (Publication Date: Dec. 2005)   Pages: ()
    • Author:  Jianjun Gao Boeck  G. Radio Eng. Dept.  Southeast Univ.  Nanjing  China;  

    • Abstract:  Abstract This paper comprehensively analyzes the relationship between common source (CS), common gate (CG), and common drain (CD) field-effect transistors (FETs). The signal and noise parameters of the CG and CD configuration can be obtained directly by using a simple set of formulas from CS signal and noise parameters. All the relationships provide a bi-directional bridge for the transformation between CS, CG, and CD FETs. This technique is based on the combination of an equivalent-circuit model and conventional two-port network signal/noise correlation matrix technique. The derived relationships have universal validity, but they have been verified at 2×40 ?m gatewidth (number of gate fingers × unit gatewidth) double-heterojunctio n ?-doped AlGaAs/InGaAs/GaAs pseudomorphic high electron-mobility transistor with 0.25-?m gate length. Good agreement has been obtained between calculated and measured results.

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