Transistors with dual work function metal gates by single full silicidation (FUSI) of polysilicon gates


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      Views: (2027)   Date: (Publication Date: 2002)   Pages: ()
    • Author:  Maszara  W.P. Krivokapic  Z. King  P. Goo  J.-S. Lin  M.-R. Technol. Res. Group  AMD  Sunnyvale  CA  USA;  

    • Abstract:  Abstract Metal gate electrodes with two different work functions, ?4.5 and ?4.9 eV for NMOS and PMOS, respectively, were obtained by single-step full silicidation of poly gates. Reduction of polysilicon depletion was ?0.25 nm. Pile-up of arsenic at the NMOS dielectric is believed responsible for NiSi work function modification. Metal gate may offer little or no gate current reduction for the same Toxinv as poly gate.

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