Comparison of SETs in bipolar linear circuits generated with an ion microbeam, laser light, and circuit simulation


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      Views: (2001)   Date: (Publication Date: Dec 2002)   Pages: ()
    • Author:  Pease  R.L. Sternberg  A.L. Boulghassoul  Y. Massengill  L.W. Buchner  S. McMorrow  D. Walsh  D.S. Hash  G.L. LaLumondiere  S.D. Moss  S.C. RLP Res. Inc.  Albuquerque  NM  USA;  

    • Abstract:  Abstract Generally good agreement is obtained between the single-event output voltage transient waveforms obtained by exposing individual circuit elements of a bipolar comparator and operational amplifier to an ion microbeam, a pulsed laser beam, and circuit simulations using SPICE. The agreement is achieved by adjusting the amounts of charge deposited by the laser or injected in the SPICE simulations. The implications for radiation hardness assurance are discussed.

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