Professor Klein from The Ohio State University Electrical Engineering Department.
Parity Routing Algorithm for Network-on-Chip developed by Amit Berman and Idit Keidar, presented at ...
This may belong to the Open University, not sure. I only say that as they do alot of documentaries l...
This may belong to the Open University, not sure. I only say that as they do alot of documentaries l...
This may belong to the Open University, not sure. I only say that as they do alot of documentaries l...
IEEE |
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Views: (2005) Date: (Publication Date: 2000) Pages: () |
Abstract: Versions: 1149 1149 Active 1149.1-2001 Active - IEEE standard test access port and boundary-scan architecture Reaffirmed 2008 1149.4-1999 Active - IEEE standard for a mixed-signal test bus 1149.6-2003 Active - IEEE Std. 1149.6 1149 Archives 1149.1-1990 Archived - IEEE standard test access port and boundary - scan architecture Superseded by 1149.1-2001 1149.1b-1994 Archived - Supplement to IEEE Std 1149.1-1990, IEEE standard test access port and boundary-scan architecture An Errata is available Superseded by 1149.1-2001 1149.5-1995 Withdrawn - IEEE standard for Module Test and Maintenance Bus (MTM-Bus) protocol Withdrawn Standard 6 February 2003 1149 Drafts P1149.4/D14, Apr 2009 Active Unapproved Draft - Standard for a Mixed-Signal Test Bus